The Resource An integrated circuit reliability model and its applicability towards improving programmable logic device reliability, by James Louis Paunicka

An integrated circuit reliability model and its applicability towards improving programmable logic device reliability, by James Louis Paunicka

Label
An integrated circuit reliability model and its applicability towards improving programmable logic device reliability
Title
An integrated circuit reliability model and its applicability towards improving programmable logic device reliability
Statement of responsibility
by James Louis Paunicka
Creator
Language
eng
Related
Cataloging source
UMR
http://library.link/vocab/creatorName
Paunicka, James Louis
Degree
Ph. D.
Dissertation year
1992.
Granting institution
University of Missouri--Rolla
Illustrations
illustrations
Index
no index present
Literary form
non fiction
Label
An integrated circuit reliability model and its applicability towards improving programmable logic device reliability, by James Louis Paunicka
Instantiates
Publication
Carrier category
volume
Carrier category code
  • nc
Carrier MARC source
rdacarrier.
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent.
Control code
26980960
Extent
xiii, 205 pages
Media category
unmediated
Media MARC source
rdamedia.
Media type code
  • n
Other physical details
illustrations.
Label
An integrated circuit reliability model and its applicability towards improving programmable logic device reliability, by James Louis Paunicka
Publication
Carrier category
volume
Carrier category code
  • nc
Carrier MARC source
rdacarrier.
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent.
Control code
26980960
Extent
xiii, 205 pages
Media category
unmediated
Media MARC source
rdamedia.
Media type code
  • n
Other physical details
illustrations.

Library Locations

    • Curtis Laws Wilson LibraryBorrow it
      400 West 14th Street, Rolla, MO, 65409, US
      37.955220 -91.772210
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