Coverart for item
The Resource Breakdown Phenomena In Semiconductors And Semiconductor Devices

Breakdown Phenomena In Semiconductors And Semiconductor Devices

Label
Breakdown Phenomena In Semiconductors And Semiconductor Devices
Title
Breakdown Phenomena In Semiconductors And Semiconductor Devices
Creator
Contributor
Subject
Language
eng
Summary
Impact ionization, avalanche and breakdown phenomena form the basis of many very interesting and important semiconductor devices, such as avalanche photodiodes, avalanche transistors, suppressors, sharpening diodes (diodes with delayed breakdown), as well as IMPATT and TRAPATT diodes. In order to provide maximal speed and power, many semiconductor devices must operate under or very close to breakdown conditions. Consequently, an acquaintance with breakdown phenomena is essential for scientists or engineers dealing with semiconductor devices. The aim of this book is to summarize the main experi
Member of
Cataloging source
EBLCP
http://library.link/vocab/creatorName
Levinshtein, Michael
Dewey number
621.38152
Index
no index present
LC call number
TK7871.85 .L463 2005eb
Literary form
non fiction
Nature of contents
dictionaries
http://library.link/vocab/relatedWorkOrContributorName
  • Kostamovaara, Juha
  • Vainshtein, Sergey
http://library.link/vocab/subjectName
  • Breakdown (Electricity)
  • High voltages
  • Semiconductors
  • Breakdown (Electricity)
  • High voltages
  • Semiconductors
Label
Breakdown Phenomena In Semiconductors And Semiconductor Devices
Instantiates
Publication
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
mixed
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
Preface; Contents; Chapter 1 Introductory Chapter; Chapter 2 Avalanche Multiplication; Chapter 3 Static Avalanche Breakdown; Chapter 4 Avalanche Injection; Chapter 5 Dynamic Breakdown; Conclusion; List of Symbols; Bibliography; Index; Author Index
Control code
476063254
Dimensions
unknown
Extent
1 online resource (223 pages)
Form of item
online
Isbn
9789812703330
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Specific material designation
remote
System control number
(OCoLC)476063254
Label
Breakdown Phenomena In Semiconductors And Semiconductor Devices
Publication
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
mixed
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
Preface; Contents; Chapter 1 Introductory Chapter; Chapter 2 Avalanche Multiplication; Chapter 3 Static Avalanche Breakdown; Chapter 4 Avalanche Injection; Chapter 5 Dynamic Breakdown; Conclusion; List of Symbols; Bibliography; Index; Author Index
Control code
476063254
Dimensions
unknown
Extent
1 online resource (223 pages)
Form of item
online
Isbn
9789812703330
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Specific material designation
remote
System control number
(OCoLC)476063254

Library Locations

    • Curtis Laws Wilson LibraryBorrow it
      400 West 14th Street, Rolla, MO, 65409, US
      37.955220 -91.772210
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