The Resource Degradations of MOSFETs from high temperature, radiation and hot electron effects, by Cheng-Fuh Jeffrey Tang

Degradations of MOSFETs from high temperature, radiation and hot electron effects, by Cheng-Fuh Jeffrey Tang

Label
Degradations of MOSFETs from high temperature, radiation and hot electron effects
Title
Degradations of MOSFETs from high temperature, radiation and hot electron effects
Statement of responsibility
by Cheng-Fuh Jeffrey Tang
Creator
Language
eng
Related
Cataloging source
UMR
http://library.link/vocab/creatorName
Tang, Cheng-Fuh Jeffrey
Degree
M.S.
Dissertation year
1987.
Granting institution
University of Missouri--Rolla
Illustrations
illustrations
Index
no index present
Literary form
non fiction
Label
Degradations of MOSFETs from high temperature, radiation and hot electron effects, by Cheng-Fuh Jeffrey Tang
Instantiates
Publication
Carrier category
volume
Carrier category code
  • nc
Carrier MARC source
rdacarrier.
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent.
Control code
16782201
Extent
vii, 81 pages
Media category
unmediated
Media MARC source
rdamedia.
Media type code
  • n
Other physical details
illustrations.
Label
Degradations of MOSFETs from high temperature, radiation and hot electron effects, by Cheng-Fuh Jeffrey Tang
Publication
Carrier category
volume
Carrier category code
  • nc
Carrier MARC source
rdacarrier.
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent.
Control code
16782201
Extent
vii, 81 pages
Media category
unmediated
Media MARC source
rdamedia.
Media type code
  • n
Other physical details
illustrations.

Library Locations

    • Curtis Laws Wilson LibraryBorrow it
      400 West 14th Street, Rolla, MO, 65409, US
      37.955220 -91.772210
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