Coverart for item
The Resource SIGMETRICS'10 : proceedings of the 2010 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems, June 14-18, 2010, New York, New York, USA, sponsored by ACM SIGMETRICS, (electronic resource)

SIGMETRICS'10 : proceedings of the 2010 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems, June 14-18, 2010, New York, New York, USA, sponsored by ACM SIGMETRICS, (electronic resource)

Label
SIGMETRICS'10 : proceedings of the 2010 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems, June 14-18, 2010, New York, New York, USA
Title
SIGMETRICS'10
Title remainder
proceedings of the 2010 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems, June 14-18, 2010, New York, New York, USA
Statement of responsibility
sponsored by ACM SIGMETRICS
Title variation
  • SIGMETRICS'10
  • Proceedings of the ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems
  • SIGMETRICS '10 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems, New York, NY, USA - June 14 - 18, 2010
Title variation remainder
proceedings of the 2010 Association for Computing Machinery Special Interest Group on Measurement and Evaluation International Conference on Measurement and Modeling of Computer systems, June 14-18, 2010, New York, New York, United States of America
Creator
Contributor
Subject
Genre
Language
eng
Cataloging source
WaSeSS
LC call number
QA76.9.E94
http://bibfra.me/vocab/lite/meetingDate
2010
http://bibfra.me/vocab/lite/meetingName
International Conference on Measurement and Modeling of Computer Systems
http://library.link/vocab/relatedWorkOrContributorName
  • ACM-Sigmetrics
  • ACM Digital Library
http://library.link/vocab/subjectName
  • Electronic digital computers
  • Digital computer simulation
Label
SIGMETRICS'10 : proceedings of the 2010 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems, June 14-18, 2010, New York, New York, USA, sponsored by ACM SIGMETRICS, (electronic resource)
Instantiates
Publication
Note
Includes index
Control code
OCM1bookssj0001139210
Dimensions
unknown
Isbn
9781450300384
Isbn Type
(print)
Specific material designation
remote
System control number
(WaSeSS)bookssj0001139210
Label
SIGMETRICS'10 : proceedings of the 2010 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems, June 14-18, 2010, New York, New York, USA, sponsored by ACM SIGMETRICS, (electronic resource)
Publication
Note
Includes index
Control code
OCM1bookssj0001139210
Dimensions
unknown
Isbn
9781450300384
Isbn Type
(print)
Specific material designation
remote
System control number
(WaSeSS)bookssj0001139210

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