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The Resource The practice of TOF-SIMS : time of flight secondary ion mass spectrometry, Alan M. Spool

The practice of TOF-SIMS : time of flight secondary ion mass spectrometry, Alan M. Spool

Label
The practice of TOF-SIMS : time of flight secondary ion mass spectrometry
Title
The practice of TOF-SIMS
Title remainder
time of flight secondary ion mass spectrometry
Statement of responsibility
Alan M. Spool
Creator
Author
Subject
Language
eng
Summary
Time of flight secondary ion mass spectrometry, TOF-SIMS, is a highly surface sensitive analytical technique that can provide information about composition with submicron lateral resolution for a wide variety of materials. In conjunction with the latest cluster ion sources, organic depth profiling is also commonly performed now. For select materials, TOF-SIMS provides unparalleled sensitivity along with excellent reproducibility, and as a mass spectrometric technique, it also provides excellent specificity in the identification of many organic materials. Of the analytical methods available, it is among the most surface sensitive, but the physical principles that underlie it are also the least understood. This volume describes the instrumentation, the physical principles behind the technique to the extent they are understood, and provides a practical approach for the interpretation of TOF-SIMS data. The use of advanced data processing methods such as multivariate statistics are described in a readily approachable manner along with guidelines to help the reader understand where they are or are not really helpful. Given a basic background in undergraduate chemistry and physics, the book will be of use to any student with an interest in the technique. While the analyses are in fact performed in a vacuum, they are conducted in the context of a wider laboratory environment where many other analytical methods are available. The place of TOF-SIMS amongst them, when it is appropriate to use this method or another, or when multiple methods should be used in conjunction with TOF-SIMS is discussed in some depth. Examples of the wide range of applications of TOF-SIMS for research and problem solving in Academic Laboratories, National Laboratories, and Industrial laboratories, as it is applied to polymeric, biological, semiconductor, metallic, insulating, homogeneous, and inhomogeneous surfaces are described
Cataloging source
BNG
http://library.link/vocab/creatorName
Spool, Alan M
Illustrations
illustrations
Index
index present
LC call number
QC454.M3
LC item number
S666 2016
Literary form
non fiction
Nature of contents
bibliography
Series statement
Materials characterization and analysis collection.
http://library.link/vocab/subjectName
  • Time-of-flight mass spectrometry
  • Secondary ion mass spectrometry
  • Secondary ion mass spectrometry
  • Time-of-flight mass spectrometry
Label
The practice of TOF-SIMS : time of flight secondary ion mass spectrometry, Alan M. Spool
Instantiates
Publication
Copyright
Bibliography note
Includes bibliographical references and index
Carrier category
volume
Carrier MARC source
rdacarrier
Content category
text
Content type MARC source
rdacontent
Control code
MSTDDAPRINT971136953
Dimensions
23 cm.
Extent
xviii, 169 pages
Isbn
9781606507735
Media category
unmediated
Media MARC source
rdamedia
Other physical details
illustrations
Label
The practice of TOF-SIMS : time of flight secondary ion mass spectrometry, Alan M. Spool
Publication
Copyright
Bibliography note
Includes bibliographical references and index
Carrier category
volume
Carrier MARC source
rdacarrier
Content category
text
Content type MARC source
rdacontent
Control code
MSTDDAPRINT971136953
Dimensions
23 cm.
Extent
xviii, 169 pages
Isbn
9781606507735
Media category
unmediated
Media MARC source
rdamedia
Other physical details
illustrations

Library Locations

    • Curtis Laws Wilson LibraryBorrow it
      400 West 14th Street, Rolla, MO, 65409, US
      37.955220 -91.772210
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